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Electron Microscopy Workshop, July 16-20, 2006

The Workshop assessed the present state of analytical electron microscopy and its impact on the physical sciences, and identified the fundamental limits and the new science that next-generation technology should make possible.

Sunday, July 16, 2006
Charge and Keynote
John Silcox, Cornell University
Charge to the Workshop (talk)
Joel D. Brock, Applied and Engineering Physics, Cornell University
Possible Future Science with X-rays (talk)

Monday, July 17, 2006
New Instrumentation, New Science
Ondrej Krivanek, NION Co.
A Paradigm-Changing STEM (abstract)
Harald Rose, Technical University of Darmstadt
The Route Toward Sub-A and 0.1eV Analytical Electron Microscopy (abstract), talk)
Nestor Zaluzec, Argonne National Laboratory
Is There an Electron Optical Beam Line in Your Future? (abstract, talk)
David Williams, Lehigh University
Atomic Resolution EDX (abstract, talk)
Evening Talks
Phil Batson, IBM T.J. Watson Research Center
Instrumental and Physical Limitations of Sub-Angstrom Microscopy (abstract, talk)
Andrew Bleloch, Daresbury SuperSTEM Facility
Stability, Brightness and EELS of Single Atoms (abstract, talk)
Bryan Reed, LLNL/UC Davis
The Potential of the Dynamic TEM for In-Situ Microscopy (abstract, talk)

Tuesday, July 18, 2006
New Instrumentation, New Science (continued)
Joachim Frank, HHMI/Wadsworth Center
The Future of Cryo-Electron Microscopy (abstract)
Richard Leapman, National Institutes of Health
EELS of Biological Structures (abstract, talk)
John Spence, Arizona State University
Ink-jet Protein Crystallography Using Electron and X-ray Diffraction (abstract, talk)
Suzanne Stemmer, UC Santa Barbara
Quantifying Image Contrast in Experimental HAADF/STEM (abstract)

Wednesday, July 19, 2006
The Microscope as a Laboratory
Christian Colliex, CNRS, Université Paris Sud
Mapping Physical Properties of Individual Nanostructures at the Sub NM Level
(abstract, talk)
Akira Tonomura, Hitachi Advanced Research Laboratory
Field-emission Electron Microscopes to Observe Microscopic Phase Objects
(abstract, talk)
Frances Ross, IBM T.J. Watson Research Center
Dynamic Microscopy of Liquid-Phase Growth (abstract)
John Cumings, University of Maryland
The Electron Microscope as a Nanolaboratory (abstract, talk)

Thursday, July 20, 2006
Inelastic Scattering
Gianluigi Botton, McMaster University
High Resolution Electron Energy Loss Near Edge Structures (abstract, talk)
Les Allen, University of Melbourne
Simulation and Analysis of High Resolution Images and Spectra (abstract, talk)
Archie Howie, University of Cambridge
Some Discussion Points in Spatially-resolved Low-loss Spectroscopy (abstract, talk)
David Muller, Cornell University
EELS in Materials Science (abstract, talk)

Closing Panel
The Big Questions (summary)